← Leaderboards
Ronald D Blanton
Carnegie Mellon University
$5,460,847
Attributed
$7,569,575
Total exposure
15
Grants
12
Lead (contact PI)
Attributed= this PI's even-split share of every grant they're on (the fair, additive number). Exposure = full size of all those grants.
Funding over time
peak $2.4M · FY2008–23$2.5M$1.9M$1.3M$625K$0
'08
'09
'10
'11
'12
'13
'14
'15
'16
'17
'18
'19
'20
'21
'22
'23
Funding mix
By agency
NSF$7,569,575 · 15
By mechanism
—$7,569,575 · 15
Top collaborators
- Radu Marculescu2 shared
- Diana Marculescu1 shared
- Donald E Thomas1 shared
- Jeff Schneider1 shared
- Jeyanandh Paramesh1 shared
- Kenneth Mai1 shared
- Pranab K Nag1 shared
Grant awards (15)
Collaborative Research: CISE: Large: Cross-Layer Resilience to Silent Data Corruption$750,000
· FY2023 · CSE · contact PI
SHF: Small: Fault Model Evaluation and Discovery$478,330
· FY2018 · CSE · contact PI
SHF: Small: Energy Efficient Learning on Chip with Quantized Representations$473,432
· FY2018 · CSE
SHF: Small: Test Chip Design for Maximal Yield Learning$466,000
· FY2015 · CSE · contact PI
SHF: Large: High-Performance, Low-Power, Self-Evolving Integrated Systems through Statistical Learning in Chip (SLIC)$2,237,363
· FY2013 · CSE · contact PI
On-Chip Diagnosis for Aging and Early-Life Failure Detection$192,000
· FY2013 · CSE · contact PI
SBIR Phase II: Integrated Circuit Yield and Quality Improvement thru Test Data Analysis$616,000
· FY2012 · TIP
SHF:Small:Test Data Learning for Ultra High Dignostic Resolution$450,000
· FY2012 · CSE · contact PI
Planning Grant: I/UCRC for Nexys: Next Generation Electronic System Design$14,450
· FY2012 · ENG
II-NEW: Infrastructure Acquisition for Research and Education in Statistical Design$439,000
· FY2010 · CSE · contact PI
SBIR Phase I: Design for Manufacturability Rule Evaluation using Test Measurement Data$100,000
· FY2010 · TIP · contact PI
SHF: Small: Achieving IC Quality through On-Going Diagnosis and Customized Test$357,000
· FY2009 · CSE · contact PI
Collaborative Research: Globally Optimized Robust Systems on Multi-Core Hardware$222,000
· FY2009 · CSE · contact PI
SBIR Phase I: IC Yield and Quality Improvement thru Test Data Analysis$150,000
· FY2008 · TIP · contact PI
ITR (ASE + NHS) - (sim + dmc): Infrastructure Creation for Future Generation Test, Diagnosis and Yield Learning$624,000
· FY2004 · CSE · contact PI