← Leaderboards
Angelo Gaitas
Kytaro Inc.
$3,329,925
Attributed
$3,404,859
Total exposure
13
Grants
13
Lead (contact PI)
Attributed= this PI's even-split share of every grant they're on (the fair, additive number). Exposure = full size of all those grants.
Funding over time
peak $999.9K · FY2007–25$1M$750K$500K$250K$0
'07
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'25
Funding mix
By agency
NSF$3,404,859 · 13
By mechanism
—$3,404,859 · 13
Top collaborators
- Cagliyan Kurdak1 shared
Grant awards (13)
CAREER: Advanced Intracellular Thermodynamic Biosensing Using Microdevices$477,088
· FY2025 · ENG · contact PI
CAREER: Advanced Intracellular Thermodynamic Biosensing Using Microdevices$444,991
· FY2025 · ENG · contact PI
I-Corps: Translation Potential of a Wearable, Wireless Temperature Sensor for Continuous and Non-Invasive Monitoring$50,000
· FY2025 · TIP · contact PI
I-Corps: Translation Potential of a Wearable, Wireless Temperature Sensor for Continuous and Non-Invasive Monitoring$27,846
· FY2025 · TIP · contact PI
A microfluidic-based weighing scale with picogram resolution for single-cell mass measurements$600,120
· FY2024 · BIO · contact PI
A nanoscale thermocouple on a micromachined cantilever for intracellular temperature measurements$490,564
· FY2022 · BIO · contact PI
SBIR Phase I: Electrophysiology and fluidic delivery with a nano patch-clamp probe$150,000
· FY2013 · TIP · contact PI
SBIR Phase II: ERC-Small Business: Micromachined Thermal Probes for Localized Nano-Manufacturing$199,920
· FY2011 · TIP · contact PI
STTR Phase I: Advanced Uncooled Infrared Detectors at the Nano-Scale$149,869
· FY2010 · TIP · contact PI
SBIR Phase II: A High-Throughput Scanning Probe Microscope Using Micromachined Ultracompliant Probe Arrays with Embedded Sensors for Simultaneous Topography and Thermal Imag$514,694
· FY2008 · TIP · contact PI
SBIR Phase I: A High-Throughput Scanning Probe Microscope Using Micromachined Ultracompliant Probe Arrays with Embedded Sensors for Simultaneous Topography and Thermal Imaging$99,998
· FY2007 · TIP · contact PI
SBIR Phase I: Micromachined Four Point Probes for Electrical Characterization at the Nano-Scale$99,844
· FY2007 · TIP · contact PI
SBIR Phase I: Low Noise Scanning Thermal Microscopy for Defect Detection and Characterization of Semiconductor Materials$99,925
· FY2004 · TIP · contact PI