ALL SPACE MISSION ELECTRONICS FACE A HIGH RISK OF RADIATION-INDUCED DAMAGE. DEEP SPACE MISSIONS WITH A MISSION PERIOD LONGER THAN 20 YEARS MAY ENCOUNTER EARLY FAILURE DUE TO RADIATION SUSCEPTIBILITY OF COMMERCIAL OFF THE SHELF (COTS) SEMICONDUCTOR CHIPS AS THEY HAVE LIMITED LIFETIME WARRANTY. SMALL SATELLITE MISSIONS FACE EVEN MORE SEVERE RADIATION VULNERABILITY ISSUES AS THE SIZE AND MASS CONSTRAINT DOES NOT ALLOW CONVENTIONAL RADIATION COUNTERMEASURES. NASA AMES RESEARCHERS HAVE DEVELOPED A SELF HEALING IMMUNE SYSTEM AS AN ADD-ON FEATURE FOR ANY TYPE OF COTS CHIPS WHICH WOULD MONITOR THE AGING/DEGRADATION ACTIVITY AND THEN SELF-HEAL ANY RADIATION-INDUCED DAMAGE APPROPRIATELY WITH NO INCREASE IN SIZE OR FOOTPRINT AND NEGLIGIBLE INCREASE IN WEIGHT. THEY HAVE DEMONSTRATED THIS CONCEPT AT SINGLE TRANSISTOR LEVEL. OUR PROPOSAL EXTENDS THIS DEMONSTRATION TO CIRCUIT LEVEL INCLUDING STATISTICAL ANALYSIS BY DOING THIS DEMO IN MULTIPLE DEVICES AND GATHERING STATISTICAL DATA.