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OPTICAL/INFRARED MICROSCOPY AND SPECTROSCOPY SYSTEM FOR THE CHARACTERIZATION OF POINT DEFECTS AND CARRIER DYNAMICS IN 2D AND 3D SEMICONDUCTORS

$413,828FY2019Department of the ArmyDOD

University Of Texas At Arlington, Arlington TX

Investigators

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OPTICAL/INFRARED MICROSCOPY AND SPECTROSCOPY SYSTEM FOR THE CHARACTERIZATION OF POINT DEFECTS AND CARRIER DYNAMICS IN 2D AND 3D SEMICONDUCTORS · GrantIndex