GGrantIndex
← Search

ACQUISITION OF A FOCUSED ION BEAM-SCANNING ELECTRON MICROSCOPE (FIB-SEM) TO FACILITATE HIGH-RESOLUTION INTERROGATION OF COMPLEX MATERIAL SYSTEMS (DUR

$995,000FY2012Department of the NavyDOD

Trustees Of The Colorado School Of Mines

Investigators

View source on USAspending →
ACQUISITION OF A FOCUSED ION BEAM-SCANNING ELECTRON MICROSCOPE (FIB-SEM) TO FACILITATE HIGH-RESOLUTION INTERROGATION OF COMPLEX MATERIAL SYSTEMS (DUR · GrantIndex