GOALI: An Integrated Submillimeter-Wave Scattering Parameter Measurement System Based on the Six-Porter Reflectometer

University Of Virginia Main Campus, Charlottesville VA

Investigators

Abstract

The objective of this proposal is to initiate a joint research effort teaming the University of Virginia and Virginia Diodes, Inc. to develop a robust measurement infrastructure for the submillimeter region of the electromagnetic spectrum. This work will address major difficulties and challenges that are associated with measuring and characterizing systems and devices at submillimeter-wave frequencies. The two primary research activities to be undertaken during this project are: (1) the design and prototyping of six-port ref;ectometer architectures suitable for measurements at submillimeter wavelengths and (2) the development of integrated diode- based sensors. These objects are aimed at producing integrated diode-based instruments capable of measuring scattering parameters in the 295{320 GHz and 575{640 GHz frequency bands (1) The intellectual merit of this project lies in its potential to signicantly expand and improve present-day measurement capabilities in the terahertz portion of the spectrum. The terahertz region of the spectrum remains largely unexplored and the scarcity of reliable and robust instrumentation remains a major obstacle to the full use and scientific investigation of this spectral region. (2) The broad impact of this proposed work will be felt not only by the engi- neers focusing on developing high-frequency circuits and devices, but by a wide variety of scientists working in many different areas of fundamental research. Successful development of the instrument proposed here would have a direct and signicant impact on radio astronomy, atmospheric re- mote sensing, molecular spectroscopy, and biological sensing fields that rely critically upon the availability of submillimeter components, devices, and instruments. The program will team researchers from the University of Virginia and engineers at Virginia Diodes, Inc. focusing on the investigation, design, and prototyping of fully integrated sensor arrays for measuring submillimeter scattering parameters using six-port reflectometer archi- tectures. The project will culminate with the fabrication and demonstration of compact, integrated instruments operating in the 295{320 GHz and 575{640 GHz spectral regions, fre- quency bands that are important for a number of ongoing scientific research initiatives in astronomy, spectral sensing, and imaging. A-1