Nanoelectromechanics of Piezoelectric Indentation and Applications to Scanning Probe Microcopies

Tufts University, Medford MA

Investigators

Abstract

Abstract 0509936 With the advent of nanoindentation and scanning probe microscopy (SPM) techniques, such as piezoelectric force microscopy, atomic force acoustic microscopy and ultrasonic force microscopy, it has become possible to probe electromechanical properties of materials at the nanoscale. This is critical for the study of microelectromechanical systems, composites and complex oxides (ferroelectrics and piezoelectrics) as well as biomaterials. Ferroelectrics are used in nanoelectromechanical systems as random access memories. Their actual implementation requires the capability to quantitatively probe properties of ferroelectrics at 10nm length scale. However, the lack of quantitative aspects of SPM techniques hinders development of the quantitative imaging of nanoscale electromechanical properties. To propel electromechanical SPMs and nano-indentation techniques to a quantitative characterization tool, the main challenge remains quantitative electromechanics of various tip-surface junctions - the piezoelectric contact mechanics. The investigators in their study are addressing these problems. These results are relevant at hierarchy of length scales, from the millimeter (biological tissues) to the nanometer (bio-applications at the level of cells).