Acquisition of a Structural Monitoring System for a Laser Molecular Beam Epitaxy/Scanning Tunneling Microscope Facility for Materials Research and Education

Florida International University, Miami FL

Investigators

Abstract

This award from the Instrumentation for Materials Research program supports Florida International University with the acquisition of a structural monitoring system for a laser- molecular beam epitaxy (LMBE)-scanning tunneling microscope system. The PI's will construct comprehensive tools with multi-component growth capability coupled with in-situ nano-scale characterization capabilities. This is essential for success in "Complex Materials Growth by Design." The in-situ structural monitoring system includes a newly designed in-situ reflection high-energy electron diffraction (RHEED) instrument for real-time monitoring of materials growth and low-energy electron diffraction (LEED I-V) optics for surface structure determination will be the essential component for the studies of artificial structured materials. The system will be added on a pulsed laser deposition (PLD) system, forming a controlled growth LMBE facility. This facility will be integrated with a variable temperature (VT) (25 - 1500K) scanning tunneling microscope (STM) and other existing surface characterization probes with a growth capability in an ultra-high vacuum (UHV) cluster. The objective is to construct a unique facility capable of growing and characterizing materials in-situ for interdisciplinary research and education of materials scientists in the new field of nano-technology. The goal is to: 1) exploit materials tailoring for desired functionalities, 2) explore new physical phenomena in artificially structured materials, and 3) educate a new breed of materials scientists with an expertise in science-driven nano-fabrication. This award from the Instrumentation for Materials Research program supports Florida International University with the acquisition of a structural monitoring system for a laser- molecular beam epitaxy (LMBE)-scanning tunneling microscope system. The PI's will construct comprehensive tools with multi-component growth capability coupled with in-situ nano-scale characterization capabilities. This is essential for success in "Complex Materials Growth by Design." The in-situ structural monitoring system includes a newly designed in-situ reflection high-energy electron diffraction instrument for real-time monitoring of materials growth and low-energy electron diffraction optics for surface structure determination will be the essential component for the studies of artificial structured materials. The system will be added on a pulsed laser deposition system, forming a controlled growth LMBE facility. This facility will be integrated with a variable temperature (VT) (25 - 1500K) scanning tunneling microscope and other existing surface characterization probes with a growth capability in an ultra-high vacuum cluster. The objective is to construct a unique facility capable of growing and characterizing materials in-situ for interdisciplinary research and education of materials scientists in the new field of nano-technology. The goal is to: 1) exploit materials tailoring for desired functionalities, 2) explore new physical phenomena in artificially structured materials, and 3) educate a new breed of materials scientists with an expertise in science-driven nano-fabrication.