Acquisition of a Field Emission Scanning Electron Microscope (FESEM) to Enhance Research and Education in Engineered Particulates

New Jersey Institute Of Technology, Newark NJ

Investigators

Abstract

OIA-0116595 PI: Dave Abstract The PI and four colleagues in the Mechanical Engineering and the Chemical Engineering Departments request funding for the purchase of a field emission scanning electron microscope (FESEM). This instrument will be used in their research in particle technology. It will enhance their capability to characterize particles at nano and submicron scales. When such data are incorporated into their predictive numerical model, better results are anticipated. The institutional support of NJIT is very strong with cost-sharing at ~50% level.